688欧美人禽杂交狂配,九九久久精品国产免费看小说,18无码粉嫩小泬无套在线观看,一区二区伊人久久大杳蕉,8x国产精品视频

股票代碼:301095
聯(lián)系我們
DFT 設(shè)計(jì)服務(wù) (DFT Design Service)
DFT(Design for Test)技術(shù)作為業(yè)界的標(biāo)準(zhǔn)手段,通過在芯片設(shè)計(jì)時(shí)加入測(cè)試專用電路,增加芯片的可測(cè)試性
簡介

DFT(Design for Test)技術(shù)作為業(yè)界的標(biāo)準(zhǔn)手段,通過在芯片設(shè)計(jì)時(shí)加入測(cè)試專用電路,增加芯片的可測(cè)試性。如何降低測(cè)試成本,同時(shí)測(cè)試電路占用芯片設(shè)計(jì)上較小的面積,達(dá)到更高的故障覆蓋率,已成為當(dāng)前產(chǎn)業(yè)界的一個(gè)關(guān)鍵難題。
廣立微與子公司億瑞芯聯(lián)合推出可測(cè)性設(shè)計(jì)自動(dòng)化和良率診斷解決方案及服務(wù)。成功案例包括國內(nèi)多家頭部的設(shè)計(jì)公司,產(chǎn)品涵蓋MCU,ADAS, GPU, CPU,AI,5G, Video。用戶可輕松應(yīng)對(duì)復(fù)雜的SoC芯片、大規(guī)模芯片的診斷測(cè)試、汽車電子的功能性安全測(cè)試以及良率提升等挑戰(zhàn),取得質(zhì)量與成本雙贏。

Architecture Definition

  • Test Mode Definition
  • IO plan、Test Plan、Burn-In plan
  • MBIST、Repair、SCAN、Logic BIST、In-System-Test、BSCAN Structure Definition
  • 3rd-party IP Test Interface Definition

Automotive DFT

  • In-System-Test
    IST Controller and LBIST Controller Insertion
    DMA Mode IST Integration to Support Power Self-test
    CPU Interface IST Integration to Support Periodic Self-test
    IST +MBIST+LBIST Verification
  • Low DPPM solution
    Automotive Level ATPG
    User Defined MBIST Algorithm
    High Coverage Implementation( Scan Structure + Testpoint)

DFT Flow Development

  • DFT Insert:IST Controller、MBIST、Repair、BSCAN、IJTAG Network、OCC、Compress Structure、Logic BIST Controller  Insertion
  • SCAN Insertion and Hierarchical ATPG
  • Pre-sim+Post-sim Simulation Environment
  • Formal Check、 DFT SDC Integration
  • Cell Aware ATPG、Diagnosis and Yield Improvement Flow

DFT Project Implementation

  • RTL Insertion
    Block level and Top level Insertion for MBIST,Compress, OCC, BSCAN, LBIST, IST, IJTAG Network 
  • Scan Insertion
    SCAN Chain、Wrapper Cell Insertion and EDT Connection
  • ATPG
    Graybox Generation and DC/AC ATPG 
  • Simulation
    MBIST、BSCAN、IJTAG Network、Chain/AC/DC Simulation
  • SDC
    MBIST&AC Capture、Scan Shift、DC Capture SDC Generation,F(xiàn)lattern SDC Generation
  • Formal Check
    Pre-DFT vs Post-DFT

Diagnosis and Yield Improvement

  • ATPG Diagnosis
    Diagnosis Environment Setup
    Chain Diagnosis Flow Build up
    Layout Aware Scan Diagnosis
    Transition Diagnosis
    Cell Aware Diagnosis
    Yield Analysis Flow Setup
  • MBIST Diagnosis
    Build Lab MBIST Diagnosis
    Build Mass Products MBIST Diagnosis